“An Improved Test Data De-Compressor on Chip”
(Patent number: 2892/MUM/2014)
(Filed on: November 11, 2014
Published on: March 25, 2016)
The proposed invention relates to an improved test data de-compressor for system on chip. In particular, the proposed invention relates to an improved test data de-compressor which significantly reduces Integrated Circuit (IC) testing time and in turn testing cost
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